- Patent Title: Exposure device and out-of-focus and tilt error compensation method
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Application No.: US15515110Application Date: 2015-07-13
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Publication No.: US10197923B2Publication Date: 2019-02-05
- Inventor: Feibiao Chen , Chang Zhou , Yuefei Chen , Qi Cheng , Lei Diao , Jingchao Qi
- Applicant: SHANGHAI MICRO ELECTRONICS EQUIPMENT CO., LTD.
- Applicant Address: CN Shanghai
- Assignee: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Current Assignee: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Current Assignee Address: CN Shanghai
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: CN201410508363 20140928
- International Application: PCT/CN2015/083842 WO 20150713
- International Announcement: WO2016/045432 WO 20160331
- Main IPC: G03F7/20
- IPC: G03F7/20 ; H01L21/027 ; G03F9/00

Abstract:
In an exposure apparatus and a method for defocus and tilt error compensation, each of alignment sensors (500a, 500b, 500c, 500d, 500e, 500f) corresponds to and has the same coordinate in the first direction as a respective one of focusing sensors (600a, 600b, 600c, 600d, 600e, 600f), so that each of the alignment sensors (500a, 500b, 500c, 500d, 500e, 500f) is arranged on the same straight line as a respective one of the focusing sensors (600a, 600b, 600c, 600d, 600e, 600f). As such, alignment marks can be characterized with both focusing information and alignment information. This enables the correction of errors in the alignment information and thus achieves defocus and tilt error compensation, resulting in significant improvements in alignment accuracy and the production yield.
Public/Granted literature
- US20170219935A1 EXPOSURE DEVICE AND OUT-OF-FOCUS AND TILT ERROR COMPENSATION METHOD Public/Granted day:2017-08-03
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