Invention Grant
- Patent Title: Detector assembly for analysis of elemental composition of a sample using optical emission spectroscopy
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Application No.: US15607829Application Date: 2017-05-30
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Publication No.: US10197445B2Publication Date: 2019-02-05
- Inventor: Jukka Hassi
- Applicant: Oxford Instruments Industrial Products Ltd.
- Applicant Address: GB Oxfordshire
- Assignee: Hitachi High-Tech Analytical Science Limited
- Current Assignee: Hitachi High-Tech Analytical Science Limited
- Current Assignee Address: GB Oxfordshire
- Agency: Harrington & Smith
- Priority: EP16171905 20160530
- Main IPC: G01J3/30
- IPC: G01J3/30 ; G01J3/443 ; G01J3/02 ; G01N21/71 ; G01N21/359 ; G01N21/65

Abstract:
According to an example embodiment, a detector assembly for use in analysis of elemental composition of a sample by using optical emission spectroscopy is provided, the detector assembly including a rotatable element that is rotatable about an axis and that has attached thereto a laser source for generating laser pulses for invoking optical emission on a surface of the sample, the laser source arranged to generate laser pulses focused at a predefined distance from said axis at a predefined distance from a front end of the detector assembly, and a detector element for capturing optical emission invoked by said laser pulses.
Public/Granted literature
- US20170343416A1 Detector Assembly for Analysis of Elemental Composition of a Sample Using Optical Emission Spectroscopy Public/Granted day:2017-11-30
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