- Patent Title: Measurement by atomic interferometry with multiple species of atoms
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Application No.: US15549697Application Date: 2016-02-10
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Publication No.: US10178752B2Publication Date: 2019-01-08
- Inventor: Nassim Zahzam , Yannick Bidel , Alexandre Bresson , Alexis Bonnin
- Applicant: ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
- Applicant Address: FR Palaiseau
- Assignee: ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
- Current Assignee: ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
- Current Assignee Address: FR Palaiseau
- Agency: Young & Thompson
- Priority: FR1551267 20150216
- International Application: PCT/FR2016/050301 WO 20160210
- International Announcement: WO2016/132047 WO 20160825
- Main IPC: H05H3/02
- IPC: H05H3/02 ; G01V7/00 ; G01C19/58 ; G01P15/08 ; G01J9/02 ; G01P15/093

Abstract:
Disclosed is a method for measuring an external parameter by atomic interferometry, using two sets of atoms that belong to different species. Two measurements are taken simultaneously at the same location, but independently from one another, in order to obtain two measurement results. One of these measurement results removes an indeterminacy among several possible values of the external parameter, by taking into account only the other measurement result. A method of this kind can be used to measure a coordinate of a gravitational field or a coordinate of an acceleration of the atoms.
Public/Granted literature
- US20180020534A1 MEASUREMENT BY ATOMIC INTERFEROMETRY WITH MULTIPLE SPECIES OF ATOMS Public/Granted day:2018-01-18
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