Invention Grant
- Patent Title: Method of manufacturing a device with a cavity
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Application No.: US15846727Application Date: 2017-12-19
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Publication No.: US10171007B2Publication Date: 2019-01-01
- Inventor: Greja Johanna Adriana Maria Verheijden , Roel Daamen , Gerhard Koops
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Priority: EP08103686 20080423
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/768 ; H01L21/02 ; H01L29/84 ; H01L21/50 ; B81C1/00 ; H02N1/00 ; H01L21/311

Abstract:
A method includes providing a substrate having a first sacrificial oxide region, the substrate comprising a first interconnect layer, the first interconnect layer comprising the first sacrificial oxide region. The method further includes covering the first sacrificial oxide region with a first porous layer being permeable to a vapor hydrofluoric acid (HF) etchant and selectively etching the first sacrificial oxide region through the first porous layer using the vapor HF etchant.
Public/Granted literature
- US20180109203A1 Method of Manufacturing a Device with a Cavity Public/Granted day:2018-04-19
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