Invention Grant
- Patent Title: Route examining system and method
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Application No.: US15075118Application Date: 2016-03-19
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Publication No.: US10167005B2Publication Date: 2019-01-01
- Inventor: Joseph Forrest Noffsinger , Ajith Kuttannair Kumar , Yuri Alexeyevich Plotnikov , Jeffrey Michael Fries , Steven Joseph Ehret
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: GE Transportation
- Agent Shawn A. McClintic
- Main IPC: B61L23/04
- IPC: B61L23/04 ; B61L3/10

Abstract:
A route examining system includes first and second detection units and an identification unit. The first and second detection units are configured to be disposed onboard a vehicle system traveling along a route having plural conductive tracks. The first and second detection units are disposed at spaced apart locations along a length of the vehicle system. The first and second detection units are configured to monitor one or more electrical characteristics of the conductive tracks in response to an examination signal being electrically injected into at least one of the conductive tracks. The identification unit includes one or more processors configured to determine that a section of the route includes an electrical short responsive to the one or more electrical characteristics monitored by the first and second detection units indicating that the examination signal is received by only one of the first and second detection units.
Public/Granted literature
- US20160200332A1 ROUTE EXAMINING SYSTEM AND METHOD Public/Granted day:2016-07-14
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