Invention Grant
- Patent Title: Methods of fabricating three-dimensional semiconductor devices
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Application No.: US15642829Application Date: 2017-07-06
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Publication No.: US10096618B2Publication Date: 2018-10-09
- Inventor: Ki-Woong Kim , Hyo-Jung Kim , Kieun Seo , Ki Hoon Jang , Byoungho Kwon , Boun Yoon
- Applicant: Ki-Woong Kim , Hyo-Jung Kim , Kieun Seo , Ki Hoon Jang , Byoungho Kwon , Boun Yoon
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Ward and Smith, P.A.
- Priority: KR10-2016-0122389 20160923
- Main IPC: H01L21/3205
- IPC: H01L21/3205 ; H01L27/11582 ; H01L21/283 ; H01L21/3105 ; H01L27/1157 ; H01L27/11573 ; H01L21/02 ; H01L27/24

Abstract:
A method of fabricating a three-dimensional semiconductor device is provided. The method includes providing a substrate with a peripheral circuit region and a cell array region; forming a peripheral structure on the peripheral circuit region, and forming an electrode structure on the cell array region. The electrode structure includes a lower electrode, a lower insulating planarized layer on the lower electrode, and upper electrodes and upper insulating layers vertically and alternatingly stacked on the lower insulating planarized layer, and the lower insulating planarized layer may be extended to cover the peripheral structure on the peripheral circuit region. An upper insulating planarized layer is formed to cover the electrode structure and the lower insulating planarized layer on the peripheral circuit region.
Public/Granted literature
- US20180090512A1 Methods of Fabricating Three-Dimensional Semiconductor Devices Public/Granted day:2018-03-29
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