Invention Grant
- Patent Title: Method for forming semiconductor structure
-
Application No.: US15597372Application Date: 2017-05-17
-
Publication No.: US10096481B1Publication Date: 2018-10-09
- Inventor: Li-Yen Lin , Ching-Yu Chang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/306 ; H01L21/3065 ; H01L21/265

Abstract:
A method for forming a semiconductor device structure is provided. The method includes forming a bottom layer over a substrate and forming a middle layer over the bottom layer. The middle layer includes a carbon backbone and a first side chain bonded to the carbon backbone, and the first side chain has a hydrophilic group. The method includes forming a top layer over the middle layer and patterning the top layer to form a patterned top layer. The method includes patterning the middle layer by using the patterned top layer as a mask to form a patterned middle layer. The method includes patterning the bottom layer to form a patterned bottom layer. The method also includes removing the patterned middle layer by a base solution, and the middle layer is soluble in the base solution by the hydrophilic group.
Information query
IPC分类: