Invention Grant
- Patent Title: Measurement by means of atomic interferometry with multiple species of atoms
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Application No.: US15551451Application Date: 2016-02-10
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Publication No.: US10090073B2Publication Date: 2018-10-02
- Inventor: Nassim Zahzam , Yannick Bidel , Alexandre Bresson , Alexis Bonnin
- Applicant: ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)
- Applicant Address: FR Palaiseau
- Assignee: ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES
- Current Assignee: ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES
- Current Assignee Address: FR Palaiseau
- Agency: Young & Thompson
- Priority: FR1551271 20150216
- International Application: PCT/FR2016/050298 WO 20160210
- International Announcement: WO2016/132046 WO 20160825
- Main IPC: G21K1/00
- IPC: G21K1/00

Abstract:
Disclosed is a method for measuring an external parameter by atomic interferometry using two sets of atoms that belong to different species. Two measurements are taken simultaneously at the same location, but independently from one another, in order to obtain two measurement results. Constant phase shifts that appear in the atomic interferences for the two atom sets are quadrature-adjusted in order to ensure that one of the two measurements provides a value for the external parameter with satisfactory accuracy.
Public/Granted literature
- US20180040388A1 MEASUREMENT BY MEANS OF ATOMIC INTERFEROMETRY WITH MULTIPLE SPECIES OF ATOMS Public/Granted day:2018-02-08
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