Invention Grant
- Patent Title: Measurement apparatus, system, measurement method, determination method, and non-transitory computer-readable storage medium
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Application No.: US15371538Application Date: 2016-12-07
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Publication No.: US10068350B2Publication Date: 2018-09-04
- Inventor: Akihiro Yamada
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2015-244394 20151215
- Main IPC: G06T7/70
- IPC: G06T7/70 ; H04N5/225 ; H04N7/18 ; G06T7/73

Abstract:
The present invention provides a measurement apparatus for measuring at least one of a position and an attitude of a work using an image obtained by capturing the work onto which pattern light having periodically arrayed lines is projected, including a determination unit configured to determine, based on luminance information about a period direction of luminance unevenness generated, due to periodic shape unevenness of the work, in the image obtained by an image capturing unit, a base-line direction defined by a relative tilt direction between an optical axis of a projection unit and an optical axis of the image capturing unit with respect to the work so that a period direction of the pattern light is different from a period direction of the shape unevenness of the work.
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