Examples of the present disclosure provide apparatuses and methods for performing signed element compare operations. An apparatus can include a first group of memory cells coupled to a sense line and to a number of first access lines. The apparatus can include a second group of memory cells coupled to the sense line and to a number of second access lines. The apparatus can include a controller configured to operate sensing circuitry to perform a number of operations to compare a value of a first signed element stored in the first group of memory cells to a value of a second signed element stored in the second group of memory cells.