Invention Grant
- Patent Title: Memory device for detecting failure of memory cells and refreshing memory cells
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Application No.: US15066841Application Date: 2016-03-10
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Publication No.: US10043569B2Publication Date: 2018-08-07
- Inventor: Min-Su Park , Jae-Il Kim
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2015-0127476 20150909
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G11C11/406 ; G11C11/4091 ; G11C29/00

Abstract:
A memory device may include a plurality of memory cells; a refresh counter suitable for generating a refresh address; an address storage circuit suitable for storing an additional refresh address; an error detection unit suitable for detecting an error of selected memory cells of the plurality of memory cells in response to a refresh command in a detection period; and a refresh control unit suitable for refreshing memory cells corresponding to the refresh address or the additional refresh address among the memory cells in response to the refresh command, and controlling the refreshing of the memory cells to be delayed in the detection period.
Public/Granted literature
- US20170068584A1 MEMORY DEVICE Public/Granted day:2017-03-09
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