Invention Grant
- Patent Title: System for adjusting automatic analysis, method for adjusting automatic analysis
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Application No.: US14377304Application Date: 2013-02-08
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Publication No.: US10041963B2Publication Date: 2018-08-07
- Inventor: Chikook Ha
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2012-031557 20120216
- International Application: PCT/JP2013/053117 WO 20130208
- International Announcement: WO2013/122013 WO 20130822
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G06T7/00 ; G01N35/10 ; G01N35/04

Abstract:
Various mechanisms of an automatic analysis device are adjusted to suppress the occurrence of a difference in adjustment quality between an experienced person and an inexperienced person. An adjustment system includes a current position information acquiring unit for acquiring information indicating a current position of an adjustment object, a predetermined position information storage unit preliminarily storing information indicating a predetermined position where the adjustment object should be located and an adjustment value calculation unit which, by comparing the information indicating the current position of the adjustment object acquired by the current position information acquiring unites with information indicating the predetermined position of the adjustment object that has been stored in the predetermined position information storage unit, calculates an adjustment value that is required for adjusting the position of the adjustment object from the current position to the predetermined position.
Public/Granted literature
- US20150029331A1 SYSTEM FOR ADJUSTING AUTOMATIC ANALYSIS DEVICE, METHOD FOR ADJUSTING AUTOMATIC ANALYSIS DEVICE Public/Granted day:2015-01-29
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