A system includes a substrate having a surface and a circuit with a plurality of conductive paths disposed adjacent (e.g., directly on or separated by a thin layer). The circuit is configured to detect an interruption or alteration of conduction of one or more of the plurality of conductive paths due to a flaw in the substrate. The circuit is further configured to identify the interrupted or altered one or more of the plurality of conductive paths based on one or more electrical characteristics of the circuit.