Invention Grant
- Patent Title: Method for inspecting physical quantity sensor and method for manufacturing physical quantity sensor
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Application No.: US15075656Application Date: 2016-03-21
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Publication No.: US10041796B2Publication Date: 2018-08-07
- Inventor: Masahiro Oshio , Kenji Sato
- Applicant: Seiko Epson Corporation
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2015-074861 20150401
- Main IPC: G01C25/00
- IPC: G01C25/00 ; G01C19/5719 ; G01C19/5726 ; G01C19/5776

Abstract:
A method for inspecting a physical quantity sensor includes: applying a test drive signal while changing a voltage level, to an angular velocity sensor as a physical quantity sensor having a detection portion which performs detection vibration according to a physical quantity; detecting an output signal from the detection portion corresponding to the test drive signal, as a test detection signal; and performing pass/fail determination based on a change in the test detection signal in relation to the change in the voltage level.
Public/Granted literature
- US20160290828A1 Method for inspecting Physical Quantity Sensor and Method for Manufacturing Physical Quantity Sensor Public/Granted day:2016-10-06
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