Invention Grant
- Patent Title: Polishing apparatus
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Application No.: US14312641Application Date: 2014-06-23
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Publication No.: US10040166B2Publication Date: 2018-08-07
- Inventor: Osamu Nabeya , Tetsuji Togawa , Makoto Fukushima , Hozumi Yasuda
- Applicant: EBARA CORPORATION
- Applicant Address: JP Tokyo
- Assignee: EBARA CORPORATION
- Current Assignee: EBARA CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Baker & Hostetler LLP
- Priority: JP2004-318581 20041101; JP2005-079166 20050318; JP2005-145566 20050518
- Main IPC: B24B37/32
- IPC: B24B37/32 ; B24B37/20 ; B24B37/30 ; B24B47/22 ; B24B49/16 ; B24B37/005 ; B24B37/10 ; B24B49/00

Abstract:
A polishing apparatus has a polishing pad, a top ring for holding a semiconductor wafer, and a vertical movement mechanism operable to move the top ring in a vertical direction. The polishing apparatus also has a distance measuring sensor operable to detect a position of the top ring when a lower surface of the top ring is brought into contact with the polishing pad, and a controller operable to calculate an optimal position of the top ring to polish the semiconductor wafer based on the position detected by the distance measuring sensor. The vertical movement mechanism includes a ball screw mechanism operable to move the top ring to the optimal position.
Public/Granted literature
- US20140302754A1 POLISHING APPARATUS Public/Granted day:2014-10-09
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