Invention Grant
- Patent Title: Glitch detection and method for detecting a glitch
-
Application No.: US15614399Application Date: 2017-06-05
-
Publication No.: US10015609B2Publication Date: 2018-07-03
- Inventor: Michael Kropfitsch , Jose Luis Ceballos
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater Matsil, LLP
- Main IPC: H04R3/00
- IPC: H04R3/00 ; H02B1/00 ; H04R29/00 ; H04R19/04 ; H04R19/00 ; H04R19/01

Abstract:
System and method for detecting a glitch is disclosed. An embodiment comprises increasing a bias voltage of a first capacitor, sampling an input signal of a first plate of the first capacitor with a time period, mixing the input signal with the sampled input signal, and comparing the mixed signal with a reference signal.
Public/Granted literature
- US20170272879A1 Glitch Detection and Method for Detecting a Glitch Public/Granted day:2017-09-21
Information query