Invention Grant
- Patent Title: Methods and apparatus for monitoring and auditing nodes using metadata gathered by an in-memory process
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Application No.: US13731509Application Date: 2012-12-31
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Publication No.: US10015063B1Publication Date: 2018-07-03
- Inventor: Thomas J. McSweeney , Nicholas Weaver , John Daniel Hushon
- Applicant: EMC IP Holding Company LLC
- Applicant Address: US MA Hopkinton
- Assignee: EMC IP Holding Company LLC
- Current Assignee: EMC IP Holding Company LLC
- Current Assignee Address: US MA Hopkinton
- Agency: Ryan, Mason & Lewis, LLP
- Main IPC: G06F15/16
- IPC: G06F15/16 ; H04L12/26 ; H04L29/08 ; G06F12/00

Abstract:
A node is monitored using metadata gathered by an in-memory process. Metadata for the node is dynamically gathered using a process running in memory; and the gathered metadata is provided to a remote server for storage. The process comprises, for example, an in-memory microkernel executing on a boot node. The metadata comprises, for example, information about physical characteristics of the node, information about one or more software packages installed on the node and/or information about one or more of an operating system, a BIOS and firmware. The gathered metadata can be processed to update a finite state machine to indicate a state of the node and/or to detect a change in state of the node.
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