Invention Grant
- Patent Title: Systems and methods for measuring side-channel signals for instruction-level events
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Application No.: US14934121Application Date: 2015-11-05
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Publication No.: US10015006B2Publication Date: 2018-07-03
- Inventor: Milos Prvulovic , Nina Basta , Robert Callan , Alenka Zajic
- Applicant: GEORGIA TECH RESEARCH CORPORATION
- Applicant Address: US GA Atlanta
- Assignee: Georgia Tech Research Corporation
- Current Assignee: Georgia Tech Research Corporation
- Current Assignee Address: US GA Atlanta
- Agency: Troutman Sanders LLP
- Agent Ryan A. Schneider; Christopher C. Close, Jr.
- Main IPC: H04L9/00
- IPC: H04L9/00 ; G09C1/00

Abstract:
Aspects of the disclosed technology provide a method comprising executing, at a first processor and over a predetermined time period, first and second instructions in repeated alternations, wherein each alternation comprises executing the first instruction a predetermined number of times followed by executing the second instruction the predetermined number of times. Further, the method comprises measuring, via a measuring apparatus, a side-channel signal that results from the first processor executing the first and second instructions in repeated alternations. Additionally, the method comprises filtering, by a second processor, a spectral component of the measured side-channel signal, and analyzing, by the second processor, the filtered spectral component of the measured side-channel signal to determine power spectral density within a frequency range of the filtered spectral component.
Public/Granted literature
- US20160127124A1 SYSTEMS AND METHODS FOR MEASURING SIDE-CHANNEL SIGNALS FOR INSTRUCTION-LEVEL EVENTS Public/Granted day:2016-05-05
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