- Patent Title: Semiconductor memory device and method of manufacturing the same
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Application No.: US13033026Application Date: 2011-02-23
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Publication No.: US10014346B2Publication Date: 2018-07-03
- Inventor: Hiroyuki Nitta
- Applicant: Hiroyuki Nitta
- Applicant Address: JP Tokyo
- Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2010-040613 20100225
- Main IPC: H01L45/00
- IPC: H01L45/00 ; H01L21/02 ; H01L27/24 ; H01L27/10 ; H01L27/06

Abstract:
According to one embodiment, a semiconductor memory device includes a first interconnect, a second interconnect, a first fringe and a second fringe. The first interconnect is connected to a first memory cell. The second interconnect is connected to a second memory cell and is arranged at a first interval from the first interconnect in a first direction. The first fringe is formed on one end of the first interconnect. The second fringe is formed on one end of the second interconnect. The first fringe and the second fringe are arranged at the first interval in a second direction orthogonal to the first direction.
Public/Granted literature
- US20110204309A1 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2011-08-25
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