Invention Grant
- Patent Title: Detector apparatus and charged particle beam system
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Application No.: US15331182Application Date: 2016-10-21
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Publication No.: US10014159B2Publication Date: 2018-07-03
- Inventor: Takaki Ishikawa
- Applicant: JEOL Ltd.
- Applicant Address: JP
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP
- Agency: The Webb Law Firm
- Priority: JP2015-208732 20151023
- Main IPC: H01J37/20
- IPC: H01J37/20 ; H01J37/244 ; H01J37/26

Abstract:
There is provided a detector apparatus capable of detecting the position or tilt angle of a sample stage with high resolution and high reliability. The detector apparatus (100) is operative to detect the position or tilt angle of the sample stage (2), and has a potentiometer (10) for detecting the position or tilt angle of the sample stage (2), an encoder (20) for detecting the position or tilt angle of the sample stage (2), and a computing unit (30) for calculating the position or tilt angle of the sample stage (2), based both on an output signal from the potentiometer (10) and on an output signal from the encoder (20).
Public/Granted literature
- US20170117117A1 Detector Apparatus and Charged Particle Beam System Public/Granted day:2017-04-27
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