Invention Grant
- Patent Title: Comparing twice-read memory cell data for error detection in a memory device
-
Application No.: US15066773Application Date: 2016-03-10
-
Publication No.: US10014071B2Publication Date: 2018-07-03
- Inventor: Min-Su Park , Jae-Il Kim , Tae-Kyun Kim , Jun-Gi Choi
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2015-0127462 20150909
- Main IPC: G11C29/08
- IPC: G11C29/08 ; G11C11/406 ; G11C11/4091 ; G11C29/00

Abstract:
A memory device may include a plurality of memory cells; an error detection unit suitable for: latching data read a first time from at least one selected memory cell of the plurality of memory cells in a detection period, comparing data read a second time from the at least one selected memory cell with the latched data, and detecting an error of the at least one selected memory cell in the detection when the date read a second time from the at least one substantially the same with the latched data.
Public/Granted literature
- US20170068583A1 MEMORY DEVICE Public/Granted day:2017-03-09
Information query